Basic Structure and Principle of Operation
The n-type Metal-Oxide-Semiconductor Field-Effect-Transistor (MOSFET) consists of a source and a drain, two highly conducting n-type semiconductor regions which are isolated from the p-type substrate by reversed-biased p-n diodes. A metal (or poly-crystalline) gate covers the region between source and drain, but is separated from the semiconductor by the gate oxide. The basic structure of an n-type MOSFET and the corresponding circuit symbol are shown in figure 7.1.1.mosfet2.gif
- Fig.7.1.1Crosssection and circuit symbol of an n-type
Metal-Oxide-Semiconductor-Field-Effect-Transistor (MOSFET)
A top view of the same MOSFET is shown in Fig. 7.1.2, where the gate length, L, and gate width, W, are identified. Note that the gate length does not equal the physical dimension of the gate, but rather the distance between the source and drain regions underneath the gate. The overlap between the gate and the source and drain region is required to ensure that the inversion layer forms a continuous conducting path between the source and drain region. Typically this overlap is made as small as possible in order to minimize its parasitic capacitance.
mosfet1.gif
- Fig.7.1.2Top view of an n-type Metal-Oxide-Semiconductor-
Field-Effect-Transistor (MOSFET)
The typical current versus voltage (I-V) characteristics of a MOSFET are shown in the figure below. Implemented is the quadratic model for the MOSFET.
mosfetiv.xls - mosfetiv.gif
- Fig.7.1.3I-V characteristics of an n-type MOSFET with VG =
5 V (top curve), 4 V, 3 V and 2 V (bottom curve)
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